18 results
Quantification of STEM-EDS With Ion Implantation
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- Journal:
- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 138-139
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- July 2016
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FIB Applications: A Historical Perspective
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- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 294-295
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- August 2014
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Elemental Quantification and Visualization of GaN Structures using APT and SIMS
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- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 2112-2113
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- August 2014
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Energy Dispersive Spectrometry Calibration For The HD -2000 STEM
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- Microscopy and Microanalysis / Volume 8 / Issue S02 / August 2002
- Published online by Cambridge University Press:
- 01 August 2002, pp. 1192-1193
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- August 2002
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Focused Ion Beam (FIB) Microscopy and Technology
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- Microscopy and Microanalysis / Volume 8 / Issue S02 / August 2002
- Published online by Cambridge University Press:
- 01 August 2002, pp. 558-559
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- August 2002
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Chemical Characterization of Silicon-Germanium Single Crystals – Initial Evaluation of the Extent of Heterogeneity
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- Microscopy and Microanalysis / Volume 8 / Issue S02 / August 2002
- Published online by Cambridge University Press:
- 01 August 2002, pp. 1490-1491
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- August 2002
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FIB Preparation of Mesa Structures for SIMS Analysis
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- Microscopy and Microanalysis / Volume 8 / Issue S02 / August 2002
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- 01 August 2002, pp. 542-543
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- August 2002
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A Method for Thinning FIB Prepared TEM Specimens after Lift-Out
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- Microscopy and Microanalysis / Volume 7 / Issue S2 / August 2001
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- 02 July 2020, pp. 940-941
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- August 2001
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TEM Specimen Preparation Techniques and Analysis of Photo-Thermo-Refractive Glasses (PTRG)
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- Microscopy and Microanalysis / Volume 7 / Issue S2 / August 2001
- Published online by Cambridge University Press:
- 02 July 2020, pp. 432-433
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- August 2001
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Calibration Method for Elemental Quantification
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- Microscopy and Microanalysis / Volume 6 / Issue S2 / August 2000
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- 02 July 2020, pp. 536-537
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- August 2000
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Revisiting the FIB TEM Lift-Out Specimen Preparation Technique
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- Microscopy and Microanalysis / Volume 6 / Issue S2 / August 2000
- Published online by Cambridge University Press:
- 02 July 2020, pp. 508-509
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- August 2000
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Diffusion of Ion Implanted Elements in Silicon by TEM And SIMS
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- Microscopy and Microanalysis / Volume 6 / Issue S2 / August 2000
- Published online by Cambridge University Press:
- 02 July 2020, pp. 1082-1083
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- August 2000
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Comparison of Elemental Detection Using Microcalorimetry, SIMS, AES and EDS (SEM, STEM, and TEM)
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- Microscopy and Microanalysis / Volume 6 / Issue S2 / August 2000
- Published online by Cambridge University Press:
- 02 July 2020, pp. 128-129
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- August 2000
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Practical Aspects of FIB Milling: Understanding Ion Beam/Material Interactions
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- Microscopy and Microanalysis / Volume 6 / Issue S2 / August 2000
- Published online by Cambridge University Press:
- 02 July 2020, pp. 502-503
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- August 2000
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Microscale Elemental Imaging of Semiconductor Materials Using Focused Ion Beam Sims
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- Microscopy and Microanalysis / Volume 4 / Issue S2 / July 1998
- Published online by Cambridge University Press:
- 02 July 2020, pp. 650-651
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- July 1998
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Material Dependence of Sputtering Behavior During Focused Ion Beam Milling: A Correlation Between Monte Carlo Based Simulation and Empirical Observation
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- Microscopy and Microanalysis / Volume 4 / Issue S2 / July 1998
- Published online by Cambridge University Press:
- 02 July 2020, pp. 858-859
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- July 1998
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Focused Ion Beam Milling and Micromanipulation Lift-Out for Site Specific Cross-Section Tem Specimen Preparation
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- MRS Online Proceedings Library Archive / Volume 480 / 1997
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- 10 February 2011, 19
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- 1997
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Effect of Hot Water Exposure on Bare Silicon Surfaces in Mos Processing
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- MRS Online Proceedings Library Archive / Volume 315 / 1993
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- 21 February 2011, 485
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- 1993
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